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Crystallographic analysis in the transmission electron microscope

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Abstract

Analysis of the symmetry elements present in electron diffraction patterns produced by the convergent beam technique allows rapid determination of the crystallographic point group. Useful space group information is obtainable from the same patterns. The technique is particularly useful in the study of precipitates and is illustrated with examples from AISI Type 316 stainless steel.

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Author notes

  1. L. P. Stoter

    Present address: Department of Metallurgy and Science of Materials, University of Oxford, Parks Road, Oxford

Authors and Affiliations

  1. H. H. Wills Physics Laboratory, Royal Fort, Tyndal Avenue, Bristol, UK

    L. P. Stoter

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  1. L. P. Stoter
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Stoter, L.P. Crystallographic analysis in the transmission electron microscope. J Mater Sci 16, 1356–1366 (1981). https://doi.org/10.1007/BF01033852

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  • DOI: https://doi.org/10.1007/BF01033852

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