Summary
Resistance to copper's toxicity inS. cerevisiae is mediated by a copper-binding protein, metallothionein (MT). Overexpression of MT in the recombinant yeast containing multiple copies of the MT gene on plasmid leads to a four-fold increase in the critical copper resistance level and an eight-fold enhancement of specific growth rate in a 2mM CuSO4 medium compared with the parental host strain. The recombinant yeast grown in a 5mM CuSO4 medium was found to accumulate 24.1mg of Cu per g of dry cell mass.
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Han, N.S., Seo, JH. & Chung, Y.C. Growth and copper resistance of recombinantSaccharomyces cerevisiae containing a metallothionein gene. Biotechnol Lett 14, 7–10 (1992). https://doi.org/10.1007/BF01030905
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DOI: https://doi.org/10.1007/BF01030905