Abstract
The influence of M-O bond energies on the kinetics of the chemical dissolution of anodic oxide films on valve metals was analysed and the different profiles of atomic defects in these oxides were deduced. Four different equations describing the dissolution behaviour of such oxides were derived and the respective examples justifying each equation were also introduced. For many oxides, M-O bond energy was found to vary linearly with the activation energy of the dissolution. It was also found that the dissolution rate increases with increase of the initial thickness of the oxide. The dissolution processes were followed by using potential and capacitance measurements.
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Gad-Allah, A.G., Abd El-Rahman, H.A. & Abou-Romia, M.M. Influence of oxide bond energies on the kinetics of chemical dissolution of anodic oxides on valve metals. J Appl Electrochem 18, 532–537 (1988). https://doi.org/10.1007/BF01022247
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DOI: https://doi.org/10.1007/BF01022247