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Hyperfine Interactions

, Volume 10, Issue 1–4, pp 717–720 | Cite as

A new method to study the diffusion of impurities and defects by PAC

  • A. Weidinger
  • M. Deicher
Article

Keywords

Thin Film 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. [1]
    Koiwa, M., Acta Met.22 (1974) 1259Google Scholar
  2. [2]
    Swendsen, R.H. and Kehr, K.W., Solid State Commun.18 (1976) 541Google Scholar
  3. [3]
    Wipf, W. and Heidemann, A., to be publishedGoogle Scholar
  4. [4]
    Powers, R.W. and Doyle, M.V., J. Appl. Phys.30 (1959) 514Google Scholar

Copyright information

© North-Holland Publishing Company 1981

Authors and Affiliations

  • A. Weidinger
    • 1
    • 2
  • M. Deicher
    • 1
    • 2
  1. 1.Fakultät für PhysikUniv. KonstanzKonstanzGermany
  2. 2.T. Butz, Physik Dept.TU MünchenGarchingGermany

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