Hyperfine Interactions

, Volume 10, Issue 1–4, pp 717–720 | Cite as

A new method to study the diffusion of impurities and defects by PAC

  • A. Weidinger
  • M. Deicher


Thin Film 
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Copyright information

© North-Holland Publishing Company 1981

Authors and Affiliations

  • A. Weidinger
    • 1
    • 2
  • M. Deicher
    • 1
    • 2
  1. 1.Fakultät für PhysikUniv. KonstanzKonstanzGermany
  2. 2.T. Butz, Physik Dept.TU MünchenGarchingGermany

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