Hyperfine Interactions

, Volume 10, Issue 1–4, pp 717–720 | Cite as

A new method to study the diffusion of impurities and defects by PAC

  • A. Weidinger
  • M. Deicher
Article

Keywords

Thin Film 

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. [1]
    Koiwa, M., Acta Met.22 (1974) 1259Google Scholar
  2. [2]
    Swendsen, R.H. and Kehr, K.W., Solid State Commun.18 (1976) 541Google Scholar
  3. [3]
    Wipf, W. and Heidemann, A., to be publishedGoogle Scholar
  4. [4]
    Powers, R.W. and Doyle, M.V., J. Appl. Phys.30 (1959) 514Google Scholar

Copyright information

© North-Holland Publishing Company 1981

Authors and Affiliations

  • A. Weidinger
    • 1
    • 2
  • M. Deicher
    • 1
    • 2
  1. 1.Fakultät für PhysikUniv. KonstanzKonstanzGermany
  2. 2.T. Butz, Physik Dept.TU MünchenGarchingGermany

Personalised recommendations