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Temperature dependence of the electric field-gradient in metallic tin: A test case for theory

  • Hyperfine Fields: Electric Interactions
  • Metals and Alloys
  • Published:
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References

  1. J. Christiansen et al, Z. f. Phys.B24 (1976) 177

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Author notes

  1. W. Semmler

    Present address: Hahn-Meitner Institute, Berlin

Authors and Affiliations

  1. Rutgers University, 08903, New Brunswick, NJ, USA

    W. Semmler, P. Raghavan & M. Senba

  2. Bell Laboratories, 07974, Murray Hill, NJ, USA

    R. S. Raghavan (Associate of the Graduate Faculty of Rutgers University)

Authors
  1. W. Semmler
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  2. P. Raghavan
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  3. M. Senba
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  4. R. S. Raghavan
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Supported in part by the U. S. NSF.

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Semmler, W., Raghavan, P., Senba, M. et al. Temperature dependence of the electric field-gradient in metallic tin: A test case for theory. Hyperfine Interact 9, 323–327 (1981). https://doi.org/10.1007/BF01020940

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  • DOI: https://doi.org/10.1007/BF01020940

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