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Morphology of growing interfacial patterns

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Abstract

A study is made of the morphology of the interfacial patterns in the solid-on-solid model evolving from initial states very far from equilibrium. Monte Carlo simulation is used to study the time dependence of the length, the diffuseness, and the width of the interface during such evolution in the absence as well as in the presence of quenched random field. Moreover, the technique of Walsh-Fourier transform is introduced for analyzing the noise level in such interfacial patterns. A quantity is also introduced that characterizes the interfacial structure locally on a very short length scale. Finally, the latter technique is also applied to the kinetic Ising model evolving from a random initial configuration.

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Author notes

  1. Debashish Chowdhury

    Present address: School of Physical Sciences, Jawaharlal Nehru University, 10067, New Delhi, India

Authors and Affiliations

  1. Institut für Theoretische Physik, Universität zu Köln, D-5000, Köln 41, West Germany

    Debashish Chowdhury

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  1. Debashish Chowdhury
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Chowdhury, D. Morphology of growing interfacial patterns. J Stat Phys 50, 1111–1130 (1988). https://doi.org/10.1007/BF01019156

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  • DOI: https://doi.org/10.1007/BF01019156

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