Abstract
We have used non-dispersive Fourier-transformspectroscopic techniques to measure the complex indices of refraction of materials between frequencies of 120 and 550 GHz. Results are presented for crystal quartz, crosslinked polystyrene (Rexolite 1422), glass-loaded polytetrafluoroethylene (Duroid 5880) and a nickel ferrite (Trans-Tech 2-111). These results are compared with other data on these materials in this frequency range. The accuracy of these measurements yields a considerable improvement in the near-millimeter-wave characterization of several of these materials. For materials other than crystal quartz, our results are the first measurements of their properties over the entire frequency range studied.
This is a preview of subscription content, log in via an institution to check access.
Similar content being viewed by others
References
G. J. Simonis, Intl. J. Infrared and Millimeter Waves3, 439 (1982).
M. N. Afsar and K. J. Button, IEEE Trans. Microwave Theory Tech.MTT-31, 217 (1983).
J. R. Birch and T. J. Parker,Infrared and Millimeter Waves, Vol. 2, Chapter 3, ed. by K. J. Button, Academic Press, New York, N.Y. (1979).
G. W. Chantry, H. M. Evans, J. Chamberlain, and H. A. Gebbie, Infrared Phys.9, 85 (1969).
D. G. Moss, J. Phys.E10, 1170 (1977).
C. M. Randall and R. D. Rawcliffe, Appl. Opt.6, 1889 (1967).
E. V. Loewenstein and D. R. Smith, Appl. Opt.10, 577 (1971).
J. E. Chamberlain, Appl. Opt.6, 980 (1967).
G. J. Simonis, J. P. Sattler, and P. Brody, Appl. Optics (submitted for publication).
P. Brody, J. P. Sattler, and G. J. Simonis, Ferroelectrics (in press) (1983).
E. E. Russell and E. E. Bell, J. Opt. Soc. Am.57, 341 (1967).
R. G. Hones, J. Phys.D9, 819 (1976).
G. J. Simonis and R. D. Felock, Appl. Opt.22, 194 (1983).
J. Fontanella, C. Andeen, and D. Schuele, J. Appl. Phys.45, 2852 (1974).
W. F. Passchier, D. D. Konijk, M. Mandel, and M. N. Afsar, J. Phys.D10, 509 (1977).
E. V. Loewenstein, D. R. Smith, and R. L. Morgan, Appl. Opt.12, 398 (1973).
D. Charlemagne and A. Hadni, Opt. Acta16, 53 (1969).
G. J. Simonis and B. Redman, Intl. J. of Infrared and Millimeter Waves (submitted for publication).
M. N. Afsar, Ph.D. Thesis, U. London (1978).
Kappler Crystal Optics, Inc., 1244 Highland Street, Holliston, MA.
G. J. Simonis, IEEE Trans. Microwave Theory Tech.MTT-31, 356 (1983).
Technical notes on Rexolite 1422, C-LEC Plastics, Inc, Beverly, New Jersey.
K. H. Breeden and A. P. Sheppard, Microwave J., 59 (November 1967).
K. H. Breeden and A. P. Sheppard, Radio Science3, 205 (February 1968).
F. Sobel, F. L. Wentworth, and J. C. Wiltse, IRE Trans. Microwave Theory Tech.MTT-9, 512 (1961).
J. J. Taub and H. J. Hindin, Rev. Sci. Instrum.34, 1056 (1963).
J. E. Degenford and P. D. Coleman, Proc. IEEE54, 520 (1966).
A. Von Hippel,Dielectric Materials and Applications, The Technology Press of MIT and John Wiley and Sons, New York, N.Y. (1954).
W. H. Block, Master's Thesis, U. Illinois (1968).
J. M. Dutta and C. R. Jones, North Carolina Central University, Durham, N.C. (private communication).
Data sheet for RT/Duroid 5880, Rogers Corporation, Micromat Division, Box 700, Chandler, Arizona 85224, revised Jan. 1978.
Specification Bulletin on Type TT2-111 Nickel Ferrite, Trans-Tech, Inc, Adamstown, MD, Bulletin No. 120-67, Aug. 1, 1972.
R. West, Trans-Tech, Inc, Adamstown, MD (private communication).
P. A. Miles, W. B. Westphal, and A. Von Hippel, Rev. Mod. Phys.29, 279 (1957).
W. H. von Aulock, ed.,Handbook of Microwave Ferrite Materials, Academic Press, New York (1965).
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Simonis, G.J., Sattler, J.P., Worchesky, T.L. et al. Characterization of near-millimeter wave materials by means of non-dispersive fourier transform spectroscopy. Int J Infrared Milli Waves 5, 57–72 (1984). https://doi.org/10.1007/BF01014034
Received:
Issue Date:
DOI: https://doi.org/10.1007/BF01014034