Abstract
The voltage standing wave on a coplanar waveguide (CPW) is measured at W-band (75–110 GHz) using an array of bismuth microbolometers placed over the CPW. From this information, the impedance at the end of the line can be determined in addition to the complex propagation constant of the CPW. This measurement technique should also be applicable for other planar transmission lines and be extendable above 110 GHz. This work represents the highest frequency, direct measurement of a VSW on a CPW made to date.
This is a preview of subscription content, log in via an institution to check access.
Similar content being viewed by others
References
G.H. Bryant,Prindiples of Microwave Measurements (Peter Peregrinus, London, 1988), Chap. 5.
J. Fitzpatrick, “Error models for systems measurement,” Microwave J. 21 (5), 63 (1978).
D. Rubin, “De-embedding mm-wave MICs with TRL,” Microwave J. 33 (6), 141 (1990).
S. Lautzenhiser, et al., “Improve accuracy of on-wafer tests via LRM calibration,” Microwaves & RF 29 (I), 105 (1990).
E.W. Strid, “26 GHz wafer probing for MMIC development and manufacture,” Microwave J. 29 (8), 71 (1986).
Cascade Microtech, Bulletin No. PHSG-191, (1991).
H. Bieiman, “Improved on-wafer techniques evolve for MMIC testing,” Microwave J. 33 (3), 44 (1990).
T.T. Lee, et al., “Optical techniques for on-wafer measurements of MMICs,” Microwave J. 33 (5), 91 (1990).
D. H. Auston, “Probing semiconductors with femtosecond pulses,” Phys. Today 43 (2), 46 (1990).
C. Rauscher, “Picosecond reflectometry technique for on-chip characterization of millimeter wave semiconductor devices,” IEEE MTT-S Digest, p. 881 (1987).
E.L. Ginzton,Microwave Measurements (McGraw-Hill, New York, 1957), Chap. 5.
R. Majidi-ahy and D.M. Bloom, “millimetre-wave active probe frequency multiplier for on-wafer characterization of GaAs devices and ICs,” Electron. Lett. 25 (1), 6 (1990).
Z.H. Zhu, et al., “Electro-optic measurement of standing waves in a GaAs coplanar waveguide,” Appl. Phys. Lett. 50 (18), 1228 (1987).
K.J. Weingarten, et. al., “Microwave measurements of GaAs integrated circuits using electrooptic sampling,” IEEE MTT-S Digest, p. 877.
S.E. Schwarz and C.W. Turner, “Measurement technique for planar high frequency circuits,” IEEE Trans. Microwave Theory Tech. 34, 463 (1986).
D.P. Neikirk, et al., “Far-infrared microbolometer detectors,” Int. J. Infrared & Millimeter Waves 5 (3), 245 (1984).
C.R.M. Grovenor,Microelectronic Materials (Adam Highler, Bristol, 1989), p. 314.
G.E. Ponchak and R.N. Simons, “A new rectangular waveguide to coplanar waveguide transition,” IEEE MTT-S Digest (1990).
MINSQ Reference Manual (Micromath Scientific Software, Salt Lake City, UT, 1988).
T. Kitazawa and T. Itoh, “Propagation characteristics of coplanar-type transmission lines with lossy media,” IEEE Trans. Microwave Theory Tech. 39 (10), 1694 (1991).
K.C. Gupta, et al.,Microstrip Lines and Slotlines (Artech House, Norwood, MA, 1979).
E.I. du Pont de Nemours & Co., Bulletin No. E-93189, (1988), p. 20.
Jack Craig, Du Pont Co., personal communication.
M.N. Afsar, et al., “The Measurement of the properties of materials,” Proc. IEEE 74 (1), 183 (1986).
M. Tsuji, et al., “New interesting leakage behavior on coplanar waveguides of finite and infinite widths,” IEEE Tran. Microwave Theory Tech. 39 (12), 2130 (1991).
R.W. Jackson, “Considerations in the use of coplanar waveguide for millimeter wave integrated circuits,” IEEE Trans. Microwave Theory Tech. 34 (12), 1450 (1986).
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Kessler, J.R., Coleman, P.D. Impedance and complex propagation constant measurements at W-band on planar circuits. Int J Infrared Milli Waves 13, 397–424 (1992). https://doi.org/10.1007/BF01010701
Received:
Issue Date:
DOI: https://doi.org/10.1007/BF01010701