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The study of antireflecting dielectric film material on mercury cadmium telluride detector surface

  • Luo Yuanhai
  • Shu Yuwen
Article
  • 17 Downloads

Abstract

The performance of Mercury Cadmium Telluride (MCT) infrared detector is not only determined by electrical parameters of material, but also by the surface state of sensitive element.

This paper shows that by coating the surface of 8–12u MCT detector with an antireflecting dielectric material, reflection on the surface of sensitive element is decreased and quantum efficiency is increased therefore detectivity and responsivity are increased, usually by 15–30%.

Keywords

Reflection Mercury Cadmium Surface State Quantum Efficiency 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. (1).
    U.K.H.A.Maclead. Technology of Optic Thin film p 53–92.Google Scholar
  2. (2).
    Opt. ENG. Vol. 15 No.6. 498 (1976)Google Scholar
  3. (3).
    U. S. R. K. Willardson and A. C. BeerGoogle Scholar

Copyright information

© Plenum Publishing Corporation 1988

Authors and Affiliations

  • Luo Yuanhai
    • 1
  • Shu Yuwen
    • 1
  1. 1.North China Research Institute of Electro-OpticsBeijingChina

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