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Millimeter-wave absorption measurements in low-loss dielectrics using an untuned cavity resonator

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Abstract

Millimeter wave absorption measurements are usually complicated by scattering from the sample and by standing waves resulting from internal reflections. These problems can be largely overcome by using an untuned cavity resonator. The dielectric properties of the sample are determined from a measurement of the change in cavity Q produced by introduction of the sample into the cavity. For lamellar samples, Maxwell's equations can be used to find an explicit relationship between the change in cavity Q and the samples complex refractive index. Several measuring techniques based on the use of lamellar samples are presented, and their characteristics are illustrated both analytically and by laboratory measurements at 70 GHz on PTFE, polyethylene and plexiglas.

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On leave from Département de Physique et Laboratoire de recherche en optique et laser, Université Laval, Québec, Qué., Canada, G1K 7P4

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Kremer, F., Izatt, J.R. Millimeter-wave absorption measurements in low-loss dielectrics using an untuned cavity resonator. Int J Infrared Milli Waves 2, 675–694 (1981). https://doi.org/10.1007/BF01007271

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  • DOI: https://doi.org/10.1007/BF01007271

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