Abstract
In an earlier paper [1], we reported the observation of photoconductivity from free-carrier absorption in [Hg, Cd]Te. By using samples of [Hg, Cd]Te with different electrical and alloy properties, we have improved the near-millimeter-wave (NMMW) responsivity by over two orders of magnitude. At 1.6 K a best sample responsivity of about 185 V/W and a bandwidth of over 5 MHz have been measured. This responsivity corresponds to a Johnson-noise-limited noise-equivalent-power (NEP) of 1.6 × 10−12 \({W \mathord{\left/ {\vphantom {W {\sqrt {Hz} }}} \right. \kern-\nulldelimiterspace} {\sqrt {Hz} }}\). Another sample of similar compposition yielded an NEP of 1.8 × 10−12 \({W \mathord{\left/ {\vphantom {W {\sqrt {Hz} }}} \right. \kern-\nulldelimiterspace} {\sqrt {Hz} }}\) and a 25 MHz bandwidth. These results coupled with a wide spectral sensitivity [1] indicate that [Hg, Cd]Te NMMW detectors compare very favorably with similar InSb detectors [2].
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Weber, B.A., Kulpa, S.M. A high-sensitivity near-millimeter-wave photoconductive detector using [Hg, Cd]Te. Int J Infrared Milli Waves 3, 235–240 (1982). https://doi.org/10.1007/BF01007098
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DOI: https://doi.org/10.1007/BF01007098