Abstract
These low loss materials were chosen for the first in this series of measurements of the complex parameters over the entire millimeter and submillimeter wavelength range of the spectrum. A modular, polarizing, dispersive Fourier transform spectrometer capable of operating over the range 5 mm to 0.004 mm was used to provide a continuous spectrum of the refractive index and absorption coefficient to an accuracy of five decimal places and less than 1 percent, respectively.
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References
G.W. Chantry, J.W. Fleming, P.M. Smith, W. Cudby and H.A. Willis, Chem. Phys. Lett.10, 483 (1971).
M.N. Afsar, J. Chamberlain and G.W. Chantry, IEEE Trans. Instrum. Meas.IM-25, 290 (1976).
M.N. Afsar and G.W. Chantry, IEEE Trans. Microwave Theory and Tech.MTT-25, 509 (1977).
G. Simonis, private communication.
M.N. Afsar, J.B. Hasted and J. Chamberlain, Infrared Phys.16, 301 (1976).
M.N. Afsar, National Physical Laboratory, UK report DES 42 (1977).
M.N. Afsar, Ph.D. Thesis, University of London (1978).
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Partially supported by the U.S. Army Research Office under Contract Number DAAG-29-81-K-0009 and the Office of Fusion Energy, U.S. Department of Energy, under Contract W-7405-eng-26 with Union Carbide Corporation.
Supported by the National Science Foundation.
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Afsar, M.N., Button, K.J. Millimeter and submillimeter wave measurements of complex optical and dielectric parameters of materials. Int J Infrared Milli Waves 2, 1029–1044 (1981). https://doi.org/10.1007/BF01006945
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DOI: https://doi.org/10.1007/BF01006945