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Application of the four-probe method for measuring the resistivity of nonuniform semiconductor materials

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Measurement Techniques Aims and scope

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Literature cited

  1. L. B. Valdes, Proc. IRE, 42, 2 (1954).

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  2. A. A. Meier, Izv. AN SSSR, Ser. geofiz, No. 9 (1962).

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Authors
  1. A. A. Meier
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  2. D. I. Levinzon
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Meier, A.A., Levinzon, D.I. Application of the four-probe method for measuring the resistivity of nonuniform semiconductor materials. Meas Tech 8, 427–429 (1965). https://doi.org/10.1007/BF01001796

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  • DOI: https://doi.org/10.1007/BF01001796

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