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Measurement Techniques

, Volume 14, Issue 11, pp 1732–1735 | Cite as

Accelerated determination of the reliability of logic elements

  • G. I. Chizhina
Reliability of Measures and Instruments
  • 11 Downloads

Keywords

Physical Chemistry Analytical Chemistry Logic Element 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Literature cited

  1. 1.
    A. I. Perrote, G. D. Kartashev, and K. N. Tsvetaev, Basics of Accelerated Reliability Testing of Radioelements [in Russian], Sov. Radio, Moscow (1968).Google Scholar
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    V. V. Girshberg, S. M. Domanitskii, N. P. Kutler, B. P. Petrukhin, I. V. Prangishvili, and V. V. Khodnev, Standardized Series of Semiconductor Logic and Functional Elements [in Russian], Énergiya, Moscow (1966).Google Scholar
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    E. S. Venttsel', Probability Theory [in Russian], Fizmatgiz, Moscow (1962).Google Scholar
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    I. G. Berrel'son, Yu. A. Kamenetskii, and I. F. Nikolaevskii (editors), Transistors, Parameters, Measurement Methods, and Tests [in Russian], Sov. Radio (1968).Google Scholar
  5. 5.
    B. I. Boltaks, Diffusion in Semiconductors [in Russian], Fizmatgiz, Moscow (1961).Google Scholar

Copyright information

© Consultants Bureau 1972

Authors and Affiliations

  • G. I. Chizhina

There are no affiliations available

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