Measurement Techniques

, Volume 14, Issue 11, pp 1732–1735 | Cite as

Accelerated determination of the reliability of logic elements

  • G. I. Chizhina
Reliability of Measures and Instruments


Physical Chemistry Analytical Chemistry Logic Element 
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Literature cited

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    A. I. Perrote, G. D. Kartashev, and K. N. Tsvetaev, Basics of Accelerated Reliability Testing of Radioelements [in Russian], Sov. Radio, Moscow (1968).Google Scholar
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    V. V. Girshberg, S. M. Domanitskii, N. P. Kutler, B. P. Petrukhin, I. V. Prangishvili, and V. V. Khodnev, Standardized Series of Semiconductor Logic and Functional Elements [in Russian], Énergiya, Moscow (1966).Google Scholar
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    E. S. Venttsel', Probability Theory [in Russian], Fizmatgiz, Moscow (1962).Google Scholar
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    I. G. Berrel'son, Yu. A. Kamenetskii, and I. F. Nikolaevskii (editors), Transistors, Parameters, Measurement Methods, and Tests [in Russian], Sov. Radio (1968).Google Scholar
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    B. I. Boltaks, Diffusion in Semiconductors [in Russian], Fizmatgiz, Moscow (1961).Google Scholar

Copyright information

© Consultants Bureau 1972

Authors and Affiliations

  • G. I. Chizhina

There are no affiliations available

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