Skip to main content
SpringerLink
Log in

8–15 μm thick silicon resistance strain gages with small creep for measuring strains and stresses

  • Help for Measurement Lab Technicians
  • Published:
Measurement Techniques Aims and scope

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Authors
  1. Yu. P. Sin'kov
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. V. A. Godzikovskii
    View author publications

    You can also search for this author in PubMed Google Scholar

Additional information

Translated from Izmeritel'naya Tekhnika, No. 9, p. 70, September, 1993.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Sin'kov, Y.P., Godzikovskii, V.A. 8–15 μm thick silicon resistance strain gages with small creep for measuring strains and stresses. Meas Tech 36, 1064 (1993). https://doi.org/10.1007/BF00995805

Download citation

  • Issue Date:

  • DOI: https://doi.org/10.1007/BF00995805

Keywords

Search

Navigation