Ensuring a metrological basis for analytical measurements

Published: September 1959

Volume 2, pages 661–662, (1959)
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Measurement Techniques Aims and scope

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Ensuring a metrological basis for analytical measurements. Meas Tech 2, 661–662 (1959). https://doi.org/10.1007/BF00995233

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Issue Date: September 1959
DOI: https://doi.org/10.1007/BF00995233

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