Conclusions
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1.
The normalization of metrological characteristics can and must be based on mathematical patterns of errors.
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2.
The patterns of measuring device errors obtained theoretically or experimentally can be used for formulating in documents (including accompanying documents) and graphically indicating the limiting errors over the working period of a measuring device, and determining the periods for its testing and other servicing, as well as finding the required relationship between the production and operational tolerances.
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3.
The availability in the measuring devices' normalizing and accompanying documents of graphs (or analytical relationships) similar to those shown in Fig. 4 will help the customer to select objectively the required measuring devices and to utilize them more effectively.
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Literature cited
G. V. Druzhinin, Reliability of Automatic Systems [in Russian], Énergiya, Moscow-Leningrad (1967).
A. A. Sveshnikov, Applied Methods of the Theory of Random Functions [in Russian], Sudpromgiz, Moscow (1961).
M. S. Nevel'son, Standarty i kachestvo, No. 4 (1966).
A. A. Sveshnikov, Izvestiya AN SSSR, tekhn. kibernetika, No. 3 (1964).
A. N. Kartasheva, Trustworthiness of Measurements and Criteria of the Quality in Testing Instruments [in Russian], Izd-vo standartov, Moscow (1967).
S. L. Khager, Express information of the series on “Control and measurement techniques,” Abstract 204, No. 27 (1966).
B. E. Rabinovich, Transactions of the VNIIM, No. 57 (1962).
Additional information
Translated from Izmeritel'naya Tekhnika, No. 4, pp. 5–8, April, 1968.
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Mif, N.P. Normalizing the reliability and metrological characteristics of measuring devices. Meas Tech 11, 432–436 (1968). https://doi.org/10.1007/BF00994371
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DOI: https://doi.org/10.1007/BF00994371