Skip to main content
SpringerLink
Log in

New method for measuring lagging in electromagnetic delay lines

  • Published:
Measurement Techniques Aims and scope

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Literature cited

  1. O. B. Lur'e, ZhTF, 1938, v. VIII, No. 17.

  2. L. A. Meerovich and G. P. Tatrakovskii, ZhTF, 1952, v. XXII, No. 7.

  3. A. A. Kharkevich, ZhTF, 1937, v. VII, No. 5.

  4. G. A. Levin and B. R. Levin, Vestnik NII MRTP, 1952, No. 10 (33).

  5. H. Kallmann, PIRE, 1946, No. 9.

  6. H. De Boer, A. van Weel, Philips Technical Review, 1954, v. 15, No. 11.

  7. A. van Weel, Philips Research Reports, 1952, v. VII.

  8. A. van Weel, Philips Research Reports, 1956, v. XI.

  9. C. Heuvelman, A. van Weel, Wireless Engineer, 1956, v. 33, No. 5.

  10. D. Ring, Bell syst. techn. I., 1948, v. 27, No. 2.

Download references

Authors
  1. Yu. M. Otryashenkov
    View author publications

    You can also search for this author in PubMed Google Scholar

Rights and permissions

Reprints and permissions

About this article

Cite this article

Otryashenkov, Y.M. New method for measuring lagging in electromagnetic delay lines. Meas Tech 5, 316–320 (1962). https://doi.org/10.1007/BF00992659

Download citation

  • Issue Date:

  • DOI: https://doi.org/10.1007/BF00992659

Keywords

Search

Navigation