Possibilities of a cybernetic method for raising the accuracy of electrical measuring instruments

Conclusions

• 1. The application of cybernetic methods for raising the accuracy of electrical measuring devices is completely attainable at the present development level of measurement and computing techniques.

• 2. It is possible by this method to reduce the systematic and random errors of measuring equipment and raise its accuracy by a factor of ten or more.

• 3. The most promising instruments in this respect consist of those which have the shortest timeτ for evaluating the first level. Moreover, the accuracy and speed of operation of an instrument are mutually convertible parameters, since the raising of the square of the instrument's operating speed is equivalent to raising its relative accuracy.

• 4. One of the most promising tasks of design organizations consists in developing extremely high-speed measuring instruments.

• 5. The actual possibility of producing in the very near future instruments with internal cybernetic devices which reduce the error of the instruments to 0.01–0.002% faces our metrological institutions with a pressing task of developing emf, current and resistance standards with errors required for the automatic checking of such instruments.