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Translated from Izmeritel'naya Tekhnika, No. 2, p. 36, February, 1991.
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Logvinenko, S.P., Yurko, V.G., Tsybul'ko, Y.B. et al. Long-time stability in TSAD semiconductor resistance thermometers at 0.4–4.2 K. Meas Tech 34, 174–175 (1991). https://doi.org/10.1007/BF00990826
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DOI: https://doi.org/10.1007/BF00990826