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Sequential analysis for determination of significant errors in measurements of interrelated parameters

  • General Aspects of Metrology and Measurement Engineering
  • Published:
Measurement Techniques Aims and scope

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Literature cited

  1. V. N. Khramenkov, Izmer. Tekh., No. 9, 14 (1987).

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  2. V. I. Sobolev, Information-Statistical Theory of Measurements [in Russian], Mashinostroenie, Moscow (1983).

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  3. E. S. Ventsel', Theory of Probabilities [in Russian], Fizmatgiz, Moscow (1975).

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  4. A. N. Shiryaev, Statistical Sequential Analysis [in Russian], Nauka, Moscow (1976).

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  5. B. Ya. Sovetov and S. A. Yakovlev, System Modeling [in Russian], Vysshaya Shkola, Moscow (1985).

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  6. A. Wald, Sequential Analysis [Russian translation], Fizmatgiz, Moscow (1960).

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Authors
  1. V. N. Khramenkov
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  2. P. G. Shabanov
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Additional information

Translated from Izmeritel'naya Tekhnika, No. 2, pp. 14–16, February, 1991.

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Khramenkov, V.N., Shabanov, P.G. Sequential analysis for determination of significant errors in measurements of interrelated parameters. Meas Tech 34, 132–135 (1991). https://doi.org/10.1007/BF00990815

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  • DOI: https://doi.org/10.1007/BF00990815

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