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Equipment for measuring the noise parameters of transistors at low temperatures

  • Radiotechnical Measurements
  • Published:
Measurement Techniques Aims and scope

Abstract

The construction of an adaptor for attaching transistors which enables the noise parameters of transistors to be investigated when their operating temperature is reduced to −190°C on standard measuring equipment is described. A sketch of the equipment for measuring a whole range of noise parameters of transistors at low temperatures and over the operating frequency band of microstrip lines is presented.

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References

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Authors
  1. V. N. Topol'nitskii
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Additional information

Translated from Izmeritel'naya Tekhnika, No. 10, pp. 62–64, October, 1995.

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Topol'nitskii, V.N. Equipment for measuring the noise parameters of transistors at low temperatures. Meas Tech 38, 1185–1189 (1995). https://doi.org/10.1007/BF00990581

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  • DOI: https://doi.org/10.1007/BF00990581

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