Skip to main content
Log in

Measurement of very small reflection factors

  • Measurements of Electrical and Magnetic Quantities
  • Published:
Measurement Techniques Aims and scope

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Literature cited

  1. M. A. Cheremnykh, Author's Certificate No. 212345, Byull. Izobr., No. 9 (1968).

  2. M. A. Cheremnykh, Izmeritel'. Tekh., No. 6 (1967).

  3. E. T. Momot, Radiotechnical Measurements [in Russian], GÉI, Moscow (1967).

    Google Scholar 

  4. S. F. Malikov and N. I. Tyurin, Introduction to Metrology [in Russian], Izd. Standartov (1965).

Download references

Authors

Additional information

Translated from Izmeritel'naya Tekhnika, No. 11, pp. 48–50, November, 1968.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Cheremnykh, M.A. Measurement of very small reflection factors. Meas Tech 11, 1512–1515 (1968). https://doi.org/10.1007/BF00986036

Download citation

  • Received:

  • Issue Date:

  • DOI: https://doi.org/10.1007/BF00986036

Keywords

Navigation