Literature cited
M. A. Zemel'man, Izmeritel'. Tekh., No. 11 (1966).
N. P. Mif, Izmeritel'. Tekh., No. 4 (1968).
P. V. Novitskii, Foundations of the Information Theory for Measuring Devices [in Russian], Izd. Énergiya, Moscow (1968).
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Additional information
Translated from Izmeritel'naya Tekhnika, No. 2, pp. 70–73, February, 1969.
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Zemel'man, M.A., Knyupfer, A.P. & Kuznetsov, V.P. Methods for normalizing metrological characteristics of measuring devices. Meas Tech 12, 250–255 (1969). https://doi.org/10.1007/BF00985796
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DOI: https://doi.org/10.1007/BF00985796