Advertisement

Measurement Techniques

, Volume 12, Issue 2, pp 250–255 | Cite as

Methods for normalizing metrological characteristics of measuring devices

  • M. A. Zemel'man
  • A. P. Knyupfer
  • V. P. Kuznetsov
Discussions
  • 17 Downloads

Keywords

Physical Chemistry Analytical Chemistry Metrological Characteristic 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

Literature cited

  1. 1.
    M. A. Zemel'man, Izmeritel'. Tekh., No. 11 (1966).Google Scholar
  2. 2.
    N. P. Mif, Izmeritel'. Tekh., No. 4 (1968).Google Scholar
  3. 3.
    P. V. Novitskii, Foundations of the Information Theory for Measuring Devices [in Russian], Izd. Énergiya, Moscow (1968).Google Scholar
  4. 4.
    V. P. Kuznetsov, Izmeritel'. Tekh., No. 10 (1968).Google Scholar

Copyright information

© Consultants Bureau 1969

Authors and Affiliations

  • M. A. Zemel'man
  • A. P. Knyupfer
  • V. P. Kuznetsov

There are no affiliations available

Personalised recommendations