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Methods for normalizing metrological characteristics of measuring devices

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Measurement Techniques Aims and scope

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Literature cited

  1. M. A. Zemel'man, Izmeritel'. Tekh., No. 11 (1966).

  2. N. P. Mif, Izmeritel'. Tekh., No. 4 (1968).

  3. P. V. Novitskii, Foundations of the Information Theory for Measuring Devices [in Russian], Izd. Énergiya, Moscow (1968).

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  4. V. P. Kuznetsov, Izmeritel'. Tekh., No. 10 (1968).

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Authors
  1. M. A. Zemel'man
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  2. A. P. Knyupfer
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  3. V. P. Kuznetsov
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Additional information

Translated from Izmeritel'naya Tekhnika, No. 2, pp. 70–73, February, 1969.

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Zemel'man, M.A., Knyupfer, A.P. & Kuznetsov, V.P. Methods for normalizing metrological characteristics of measuring devices. Meas Tech 12, 250–255 (1969). https://doi.org/10.1007/BF00985796

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  • DOI: https://doi.org/10.1007/BF00985796

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