Measurement Techniques

, Volume 12, Issue 2, pp 250–255 | Cite as

Methods for normalizing metrological characteristics of measuring devices

  • M. A. Zemel'man
  • A. P. Knyupfer
  • V. P. Kuznetsov
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Keywords

Physical Chemistry Analytical Chemistry Metrological Characteristic 

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Literature cited

  1. 1.
    M. A. Zemel'man, Izmeritel'. Tekh., No. 11 (1966).Google Scholar
  2. 2.
    N. P. Mif, Izmeritel'. Tekh., No. 4 (1968).Google Scholar
  3. 3.
    P. V. Novitskii, Foundations of the Information Theory for Measuring Devices [in Russian], Izd. Énergiya, Moscow (1968).Google Scholar
  4. 4.
    V. P. Kuznetsov, Izmeritel'. Tekh., No. 10 (1968).Google Scholar

Copyright information

© Consultants Bureau 1969

Authors and Affiliations

  • M. A. Zemel'man
  • A. P. Knyupfer
  • V. P. Kuznetsov

There are no affiliations available

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