Skip to main content
SpringerLink
Log in

Methods for measuring dielectric absorption of capacitors

  • Measurements of Electrical and Magnetic Quantities
  • Published:
Measurement Techniques Aims and scope

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Literature cited

  1. V. T. Renne, Capacitors [in Russian], GÉI, Moscow (1959).

    Google Scholar 

  2. P. S. Dow, IRE Trans. on Electronic Comp. VEC,7, No. 1 (1957).

  3. V. S. Tarasov, Foundations of the Theory and Design of Continuously-Acting Computers, No. 1, “Computing elements,” (Abstracts of the Leningrad Polytechnic Institute Lectures) (1961).

  4. H. Baugh and R. Frank, IRE Wiscon Conven. Rec.,1, No. 6 (1957).

  5. V. T. Renne, Film Capacitors with Organic Synthetic Dielectrics [in Russian], GÉI, Moscow (1963).

    Google Scholar 

Download references

Authors
  1. Yu. A. Tarasov
    View author publications

    You can also search for this author in PubMed Google Scholar

Additional information

Translated from Izmeritel'naya Tekhnika, No. 11, pp. 33–35, November, 1969.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Tarasov, Y.A. Methods for measuring dielectric absorption of capacitors. Meas Tech 12, 1552–1554 (1969). https://doi.org/10.1007/BF00985686

Download citation

  • Received:

  • Issue Date:

  • DOI: https://doi.org/10.1007/BF00985686

Keywords

Search

Navigation