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Measurements of resistivity in semiconductor materials

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Measurement Techniques Aims and scope

Conclusions

  1. 1.

    A technique is suggested for evaluating three types of resistivities (volume, surface, and contact) by measuring the geometry of specimens.

  2. 2.

    Formulas for computing the volume, surface, and contact resistivity were derived from an equivalent circuit. These formulas are presented in the form of nomograms.

  3. 3.

    An error analysis was used for finding optimum conditions at which the error in evaluating resistivity is at a minimum.

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Literature cited

  1. G. S. Kucherenko and I. S. Pavlov, Electrical resistance of food products, Report on new physical methods for processing food products, Kiev (1964).

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Authors
  1. I. S. Pavlov
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  2. G. S. Kucherenko
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Additional information

Deceased.

Translated from Izmeritel'naya Tekhnika, No. 4, pp. 43–46, April, 1967.

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Pavlov, I.S., Kucherenko, G.S. Measurements of resistivity in semiconductor materials. Meas Tech 10, 442–445 (1967). https://doi.org/10.1007/BF00984835

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  • DOI: https://doi.org/10.1007/BF00984835

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