Measuring the radii of templet profiles by means of heads calibrated in radii

Conclusions

Measurements of templet profile radii with existing radii-measuring heads by means of the “superposition” method and calculations of deviations from the nominal can be recommended only for tentative, approximate evaluations on microscopes BMI and MMI in the course of manufacturing the templets.

For the final control of templets after their manufacture, as well as for periodic testing of templets with radii of 0.1–25 mm (and in some cases up to 50 mm) the control and measuring instruments laboratories should use the “hump” method, preferably with a UIM-21 microscope.

It is recommended that the “constant chord” method, owing to its complexity, be used only for precision measurements either when the size of the templet radius approaches half the sum of r₁ and r₂, or when the subtending angle is small, or else when radii-measuring heads of Zeiss manufacture (types E, E2, R et al.) are used for measuring radii of 25 to 80 mm.