Conclusions
Thus, the quality standards which can be used for checking the Q-meters at ultrahigh frequencies have a simple and reliable design which ensures the stability of their parameters with time. The error in certifying these standards by means of a mass-produced measuring line and a calculated load does not exceed ±3%. The above-mentioned technique of eliminating systematic error of the mass-produced measuring line makes it possible to measure VSWR ≤10 with an error of ±3%.
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Literature cited
V. N. Krasnopistsev, Paper Read at the Scientific and Technical Conference on Radiotechnical Measurements, Vol. 1, SNIIM, Novosibirsk (1969).
L. N. Bryanskii, Precise Measurements of VSWR and Impedance in Centimeter Wavelength Range [in Russian], Standartgiz, Moscow (1963).
D. M. Kerns, J. of Res. NBS,64B, No. 2 (1960).
B. E. Rabinovich, Transactions of the VNIIM, Standartgiz, No. 57 (117), Moscow (1962).
Additional information
Translated from Izmeritel'naya Tekhnika, No. 1, pp. 44–46, January, 1971.
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Krasnopistsev, V.N., Goncharov, A.K. UHF quality standards. Meas Tech 14, 68–70 (1971). https://doi.org/10.1007/BF00982249
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DOI: https://doi.org/10.1007/BF00982249