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Opticoelectronic probe

  • Linear and Angular Measurements
  • Published:
Measurement Techniques Aims and scope

Conclusions

The opticoelectronic probe is intended for high-precision sighting of the object's reflecting surface in linear measurements. The measured objects may be smooth ring gauges, snap gauges, smooth and threaded plug gauges, gears, and similar objects with reflecting surfaces.

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Literature cited

  1. Archiv für technisches Messen und industrielle Messtechnik, No. 243, 89–92 (1956).

  2. L. N. Logacheva, Izmeritel'. Tekh., No. 2 (1965).

  3. M. L. Brzhezinskii, D. I. Zorin, and V. D. Sverdlichenko, “Photometric photoelectric microscope,” Transactions of the Committee's Institutes, No. 78 (138) (1965).

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Authors
  1. M. G. Boguslavskii
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  2. A. M. Kagan
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Additional information

Translated from Izmeritel'naya Tekhnika, No. 10, pp. 24–26, October, 1971.

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Boguslavskii, M.G., Kagan, A.M. Opticoelectronic probe. Meas Tech 14, 1493–1496 (1971). https://doi.org/10.1007/BF00981833

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  • DOI: https://doi.org/10.1007/BF00981833

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