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Development of the surface-roughness measurement techniques in the USSR

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Measurement Techniques Aims and scope

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Literature cited

  1. V. P. Linnik, Instrument for interference investigation of reflecting objects under a microscope (microinterferometer) [in Russian], DAN SSSR, No. 1 (1933).

  2. V. M. Kiselev, Electrodynamic profilorneter KV-4, In Coll.: Surface Quality of Machine Components [in Russian], Mashgiz, Moscow (1950).

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  3. V. S. Chaman, Stanki i instrument, No. 3 (1956).

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  6. B. M. Levin, Contact Method for Measuring the Microgeometry of Surfaces [in Russian], Mashgiz, Moscow (1950).

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Authors
  1. I. V. Dunin-Barkovskii
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  2. V. Ya. Éidinov
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  3. V. S. Luk'yanov
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Additional information

Translated from Izmeritel'naya Tekhnika, No. 11, pp. 32–36, November, 1967.

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Dunin-Barkovskii, I.V., Éidinov, V.Y. & Luk'yanov, V.S. Development of the surface-roughness measurement techniques in the USSR. Meas Tech 10, 1332–1336 (1967). https://doi.org/10.1007/BF00981374

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  • DOI: https://doi.org/10.1007/BF00981374

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