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Method for measuring the “residual” parameters of film resistors

  • Measurements of Electrical and Magnetic Quantities
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Measurement Techniques Aims and scope

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Literature cited

  1. M. S. Mikitinskii, Izmeritel'. Tekh., No. 3 (1960).

  2. N. A. Rylova and É. A. Abrosimov, Izmeritel'. Tekh., No. 8 (1964).

  3. B. S. Gal'perin, Nonwire-wound Resistors [in Russian], GÉI, Moscow (1959).

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Authors
  1. M. S. Mikitinskii
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Translated from Izmeritel'naya Tekhnika, No. 2, pp. 54–55, February, 1968.

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Mikitinskii, M.S. Method for measuring the “residual” parameters of film resistors. Meas Tech 11, 215–217 (1968). https://doi.org/10.1007/BF00980936

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  • DOI: https://doi.org/10.1007/BF00980936

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