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Calculation of the thermal compensation of Hall transducers with thin indium antimonide films

  • Measurements of Electrical and Magnetic Quantities
  • Published:
Measurement Techniques Aims and scope

Conclusions

  1. 1.

    In feeding indium antimonide thin-film Hall transducers from sources with a small internal resistance it is advisable to use a series thermal compensation circuit consisting of resistances which vary linearly with temperature.

  2. 2.

    A thermal compensation precision suitable for practical purposes over an adequately wide temperature range can be obtained with thermal resistances which have positive and negative coefficients.

  3. 3.

    The thermal compensation circuit is very simple and can be easily calculated.

  4. 4.

    The power loss in the thermal compensation circuit is very small.

  5. 5.

    The maximum residual error mmax can be reduced substantially by selecting a thermal compensation material with a temperature coefficient ασ for which function mmax=f(α s) intersects the axis of abscissas (for instance, in the case under consideration ασ=−1%/°C). The required values of ασ and\(r_{\delta _{20} } \) can be easily obtained by combining thermistors with temperature-stable resistances according to the technique described in [4, 5].

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Literature cited

  1. V. N. Bogomolov, Devices with Hall and Magnetoresistance Transducers [in Russian], Gosénergoizdat, Moscow (1961).

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  2. K. V. Shalimova, A. M. Gulyaev, A. S. Shnitnikov, and O. B. Kalinina, in Coll.: Semiconductor Devices and Their Application, No. 13 [in Russian], Izd. Sov. Radio (1965).

  3. E. P. Figurnov, Izv. VUZov, Élektromekhanika (1963).

  4. G. K. Nechaev, Thermistors in Automation [in Russian], GITL UkrSSR (1962).

  5. H. Albrecht, Radio und Fernsehen, No. 6 (March, 1965).

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Additional information

Translated from Izmeritel'naya Tekhnika, No. 2, pp. 48–51, February, 1968.

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Balanov, A.T., Krasilich, G.P. & Seleznev, I.I. Calculation of the thermal compensation of Hall transducers with thin indium antimonide films. Meas Tech 11, 207–210 (1968). https://doi.org/10.1007/BF00980934

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  • DOI: https://doi.org/10.1007/BF00980934

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