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Translated from Izmeritel'naya Tekhnika, No. 6, pp. 16–21, June, 1967.
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Shaevich, A.B., Simin, A.I. Special metrological features of preparing and applying standard specimens in spectral analysis. Meas Tech 10, 665–670 (1967). https://doi.org/10.1007/BF00980654
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DOI: https://doi.org/10.1007/BF00980654