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The overlapping-pulse amplitude spectrum in a semiconductor gamma spectrometer

  • Ionizing-Radiation Measurements
  • Published:
Measurement Techniques Aims and scope

Abstract

Use has been made of a device that produces pulses of identical amplitude randomly distributed in time, which has been used to measure the overlap-pulse spectra in LP4900B and AI-1024-95 pulse-height analyzers. The spectrum form and characteristics are virtually identical in the two cases. The process has been simulated by computer on the basis of the overlap-pulse formation mechanism. The calculations agree well with experiment.

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Authors
  1. A. V. Davydov
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  2. M. M. Korotkov
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  3. A. A. Sadovskii
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Additional information

Translated from Izmeritel'naya Tekhnika, No. 6, pp. 63–66, June, 1993.

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Davydov, A.V., Korotkov, M.M. & Sadovskii, A.A. The overlapping-pulse amplitude spectrum in a semiconductor gamma spectrometer. Meas Tech 36, 723–727 (1993). https://doi.org/10.1007/BF00980025

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  • DOI: https://doi.org/10.1007/BF00980025

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