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Measurement Techniques

, Volume 38, Issue 9, pp 989–992 | Cite as

Improving the accuracy of measurement of parts with contaminated surfaces by multichannel optoelectronic systems

  • V. I. Teleshevskii
  • V. V. Vasil'ev
Linear and Angular Measurements
  • 11 Downloads

Abstract

A method is proposed for improving the measurement accuracy of multichannel optoelectronic instruments in mechanical engineering. The method involves the suppression of crosstalk and processing of the measurement data in accordance with the resulting transfer function of the detector. An example of practical implementation is given.

Keywords

Physical Chemistry Analytical Chemistry Transfer Function Measurement Data Measurement Accuracy 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Plenum Publishing Corporation 1996

Authors and Affiliations

  • V. I. Teleshevskii
  • V. V. Vasil'ev

There are no affiliations available

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