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Influence of noise on measurement errors in laser interference refractometers

  • Opticophysical Measurements
  • Published:
Measurement Techniques Aims and scope

Abstract

The influence of noise in the optical and electronic channels of laser interference refractometers is subjected to a comparative analysis for several of the best-known methods used to measure the fractional part of an interference order.

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References

  1. Yu. V. Mishchenko, Izmer. Tekh., No. 5, 20 (1995).

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  2. Kh. V. Khinrikus, Noise in Laser Information Systems [in Russian], Radio i Svyaz', Moscow (1987).

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  3. Yu. V. Mishchenko, Author's Abstract of Dissertation for the Degree of Candidate of Engineering Sciences [in Russian], All-Russian Scientific-Research Institute of Optophysical Measurements (VNIIOFI), Moscow (1993).

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  4. V. I. Zhalud and V. N. Kuleshov, Noise in Semiconductor Devices [in Russian], Sov. Radio, Moscow (1977).

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Authors
  1. Yu. V. Mishchenko
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Additional information

Translated from Izmeritel'naya Tekhnika, No. 8, pp. 26–27, August, 1995.

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Mishchenko, Y.V. Influence of noise on measurement errors in laser interference refractometers. Meas Tech 38, 884–887 (1995). https://doi.org/10.1007/BF00978389

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  • DOI: https://doi.org/10.1007/BF00978389

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