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Prospects for utilizing superionic-conductor noninertial effects in metrology

  • Fundamental Problems in Metrology
  • Published:
Measurement Techniques Aims and scope

Abstract

Information is presented on a group of recently discovered physical effects, united under the general name “noninertial emfs in superionic conductors” and an analysis is made of the possibilities of applying these effects in metrology and measurement technology. It can be expected that these effects and the materials in which they are observed will enable accelerometers to be made having unique parameters, and in particular a sensitivity which is simply and directly related to the atomic constants.

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Authors
  1. M. E. Kompan
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Additional information

Translated from Izmeritel'naya Tekhnika, No. 8, pp. 3–6, August, 1995.

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Kompan, M.E. Prospects for utilizing superionic-conductor noninertial effects in metrology. Meas Tech 38, 835–841 (1995). https://doi.org/10.1007/BF00978379

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  • DOI: https://doi.org/10.1007/BF00978379

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