Abstract
The main results of experimental investigations of heterophotodiodes with the structure In2O3-SiOx-nSi and absolute radiometers utilizing such elements are discussed. An arrangement of four or even three diodes in a mirror trap geometry eliminates nonuniformity of the sensitivity, obviates the need for precise measurements of the spectral reflection coefficients of their front surfaces, and helps to reduce the error of such a radiometer to 0.1%.
Similar content being viewed by others
References
E. F. Zalewski and J. Geist, Appl. Opt.,19, 1214 (1980).
E. F. Zalewski and C. R. Duda, Appl. Opt.,22, 2867 (1983).
V. I. Kvochka et al., Pis'ma Zh. Tekh. Fiz.,13, No. 21, 1339 (1987).
V. I. Kvochka et al., in: Photometry and Its Metrological Support: Proceedings of the Seventh All-Union Scientific-Technical Conference [in Russian] (1988), p. 121.
M. B. Guseva and E. M. Dubinin, Physical Principles of Solid-State Electronics [in Russian], MGU, Moscow (1988).
V. I. Kvochka, O. A. Minaeva, and A. K. Mkrtchyan, in: Photometry and Its Metrological Support: Proceedings of the Seventh All-Union Scientific-Technical Conference [in Russian] (1988), p. 168.
S. Esida, F. Sinoki, and E. Ohota, Denshi Gijuzu Kenkose Daeho,44, Nos. 1–2, 88 (1980).
Additional information
Translated from Izmeritel'naya Tekhnika, No. 6, pp. 17–21, June, 1994
In closing, the author is grateful to V. A. Manasson for furnishing the samples and to A. K. Mkrtchyan for assisting with the measurements.
Rights and permissions
About this article
Cite this article
Kvochka, V.I. Absolute radiometry using silicon heterophotodiodes with the structure In2O3-SiOx-nSi. Meas Tech 37, 623–630 (1994). https://doi.org/10.1007/BF00978314
Issue Date:
DOI: https://doi.org/10.1007/BF00978314