Abstract
The performance of an automated system (conveyor type) for the final adjustment and testing of measuring devices is investigated, along with alternative plans of sample testing against a background of mass production of instruments, including the involvement of errors of the first and second kind (false alarm and false security) in testing.
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Additional information
Translated from Izmeritel'naya Tekhnika, No. 12, pp. 21–24, December, 1993.
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Goncharov, I.V., Revyakov, M.I. Optimal plans for monitoring the metrological characteristics of instruments in a mass-production environment. Meas Tech 36, 1341–1347 (1993). https://doi.org/10.1007/BF00978259
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DOI: https://doi.org/10.1007/BF00978259