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Optimal plans for monitoring the metrological characteristics of instruments in a mass-production environment

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Measurement Techniques Aims and scope

Abstract

The performance of an automated system (conveyor type) for the final adjustment and testing of measuring devices is investigated, along with alternative plans of sample testing against a background of mass production of instruments, including the involvement of errors of the first and second kind (false alarm and false security) in testing.

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Additional information

Translated from Izmeritel'naya Tekhnika, No. 12, pp. 21–24, December, 1993.

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Goncharov, I.V., Revyakov, M.I. Optimal plans for monitoring the metrological characteristics of instruments in a mass-production environment. Meas Tech 36, 1341–1347 (1993). https://doi.org/10.1007/BF00978259

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  • DOI: https://doi.org/10.1007/BF00978259

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