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Method for measuring the inertia of semiconductor masers

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Measurement Techniques Aims and scope

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Literature cited

  1. B. S. Coldstein and R. M. Weigand, Proc. IEEE, No. 2, 53 (1965).

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  6. M. M. Butslov, Uspekhi nauchnoi fotografii (Advanced Scientific Photography)4 (1959).

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Authors
  1. Yu. A. Drozhbin
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  2. V. V. Nikitin
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  3. A. S. Semenov
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  4. B. M. Stepanov
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  5. A. M. Tolmachev
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  6. V. A. Yakovlev
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Additional information

Translated from Izmeritel'naya Tekhnika, No. 11, pp. 92–93, November, 1966.

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Drozhbin, Y.A., Nikitin, V.V., Semenov, A.S. et al. Method for measuring the inertia of semiconductor masers. Meas Tech 9, 1500–1501 (1966). https://doi.org/10.1007/BF00977828

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  • DOI: https://doi.org/10.1007/BF00977828

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