Skip to main content
Log in

Interference setup for certification of thickness gauges for coatings in the nanometer range

  • Linear and Angular Measurements
  • Published:
Measurement Techniques Aims and scope

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Literature cited

  1. MI 1950-88. “State check scheme for devices to measure especially thin coatings in the 2–1000 nm range.”

  2. F. U. Lebowsky and P. S. Li, PTB-Mitt.,95, No. 5, 327 (1985).

    Google Scholar 

  3. C. C. Huang, Opt. Eng.,23, No. 4, 365 (1984).

    Google Scholar 

  4. F. U. Laeri and T. C. Strand, Appl. Opt.,26, No. 11, 2245 (1987).

    Google Scholar 

  5. K. H. Yang, et al., IEEE Ultrason. Symp., Oct. 14–16, Denver, CO, Vol. 2, New York (1987), p. 1175.

    Google Scholar 

  6. C. M. Sutton, J. Phys. E., Sci. Instrum.,20, No. 10, 1290 (1987).

    Google Scholar 

  7. M. A. Kos'mina and Ya. M. Tseitlin, USSR Inventor's Certificate No. 1627836 Otkryt. Izobret., No. 6 (1991).

  8. E. R. Mustel' and V. N. Parygin, Light Modulation and Scanning Methods [in Russian], Nauka, Moscow (1970).

    Google Scholar 

Download references

Authors

Additional information

Translated from Izmeritel'naya Tekhnika, No. 5, pp. 13–14, May, 1992.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Kos'mina, M.A. Interference setup for certification of thickness gauges for coatings in the nanometer range. Meas Tech 35, 542–545 (1992). https://doi.org/10.1007/BF00977577

Download citation

  • Issue Date:

  • DOI: https://doi.org/10.1007/BF00977577

Keywords

Navigation