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Precision spectral equipment for certification of instruments measuring the radiation flux of optoelectronic devices

  • Opticophysical Measurements
  • Published:
Measurement Techniques Aims and scope

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Literature cited

  1. USSR State Standard GOST 8.538-85. GSI: Government Special Reference Standard and Official Verification Procedure for Devices Measuring a Flux of Pulsed Optical Radiation in Wavelength Range 0.5–1.6 μm.

  2. USSR State Standard GOST 8.273-78. GSI: Government Special Reference Standard and National Verification Procedure for Devices Measuring Light Fluxes of 1·10−6 to 10−2 W in Wave Range 0.4–1.4 μm.

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Translated from Izmeritel'naya Tekhnika, No. 10, pp. 20–21, October, 1992.

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Lovinskii, L.S., Sorokin, V.I. Precision spectral equipment for certification of instruments measuring the radiation flux of optoelectronic devices. Meas Tech 35, 1150–1152 (1992). https://doi.org/10.1007/BF00977470

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  • DOI: https://doi.org/10.1007/BF00977470

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