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Development of an all-purpose system for the thermal stabilization of optoelectronic components

  • Opticophysical Measurements
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Measurement Techniques Aims and scope

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Literature cited

  1. A. V. Eroknin and L. S. Lovinskii, Abstract of Papers at the 7th All-Union Scientific and Technical Conference on Photometry and Its Metrological Support, Moscow (1988), p. 34.

  2. V. E. Kravtsov et al., Metrologiya, No. 8, 15 (1979).

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  3. L. S. Lovinskii and A. Kh. Zabrodskii, Abstract of Papers at the 7th All-Union Scientific and Technical Conference on Photometery and Its Metrological Support, Moscow (1984), p. 174.

  4. GOST 8.538-85. State special standard and State test system for devices for measuring pulsed optical radiation flux in the wavelength range 0.5...1.6 μm.

  5. L. I. Anatychuk, Thermoelements and Thermoelectric Devices, A Reference Book [in Russian], Naukova Dumka, Kiev (1979).

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  6. V. K. Pevzner, Precision Temperature Regulation [in Russian], Énergiya, Moscow (1973).

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Translated from Izmeritel'naya Tekhnika, No. 8, pp. 32–33, August, 1992.

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Lovinskii, L.S. Development of an all-purpose system for the thermal stabilization of optoelectronic components. Meas Tech 35, 930–932 (1992). https://doi.org/10.1007/BF00977435

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  • DOI: https://doi.org/10.1007/BF00977435

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