Abstract
It is shown that by using beam-guiding methods to measure the transmission and reflection coefficients of dielectric specimens one can increase the accuracy with which the losses in the materials are determined compared with the usual free-space and waveguide methods.
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References
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Additional information
Translated from Izmeritel'naya Tekhnika, No. 1, pp. 64–65, January, 1995.
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Meriakri, V.M., Nikitin, I.P. Measurement of low losses in dielectric materials in the millimeter and submillimeter bands. Meas Tech 38, 116–117 (1995). https://doi.org/10.1007/BF00976758
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DOI: https://doi.org/10.1007/BF00976758