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Development of a mathematical model for the degradation of the parameters of photoemission detectors and converters

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Measurement Techniques Aims and scope

Abstract

The results are given of the development of a mathematical model for the degradation of the quantum yield of photoemission detectors and converters which takes account of structural changes in emission-active surface of the sensitive elements and is based on using the apparatus of the Fokker-Planck-Kolmogorov equations.

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References

  1. A. H. Sommer, Photoemissive Materials: Preparation, Properties, and Uses, Wiley, New York (1968).

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  2. I. E. Kazakov and S. V. Mal'chikov, Analysis of Stochastic Systems in State Space [in Russian], Nauka, Moscow (1983).

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Authors
  1. V. G. Semin
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Additional information

Translated from Izmeritel'naya Tekhnika, No. 1, pp. 19–20, January, 1995.

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Semin, V.G. Development of a mathematical model for the degradation of the parameters of photoemission detectors and converters. Meas Tech 38, 30–32 (1995). https://doi.org/10.1007/BF00976742

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  • DOI: https://doi.org/10.1007/BF00976742

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