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Apparatus for measurement and visualization of the directivity pattern of radiating diodes

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Measurement Techniques Aims and scope

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Literature cited

  1. N. F. Geda, in: Measurement of Optoelectronic Device Parameters, S. V. Svechnikov (ed.), [in Russian], Radio i Svyaz', Moscow (1981).

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  2. GOST 19834.2-74. Semiconductor Emitters. Methods of Measuring the Radiation Intensity and Energetic Brightness (1974).

  3. GOST 26.201-80. CAMAC System. Crate and Interchangeable Modules. Construction and Interface Requirements (1980).

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Authors
  1. A. A. Edreev
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  2. N. I. Shumilova
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  3. G. N. Zakharova
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  4. A. A. Vilisov
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  5. P. V. Vershinin
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Additional information

Translated from Izmeritel'naya Tekhnika, No. 9, pp. 33–34, September, 1990.

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Edreev, A.A., Shumilova, N.I., Zakharova, G.N. et al. Apparatus for measurement and visualization of the directivity pattern of radiating diodes. Meas Tech 33, 909–910 (1990). https://doi.org/10.1007/BF00976566

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  • DOI: https://doi.org/10.1007/BF00976566

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