Abstract
The image formation and the spectral resolution of a 5m echelle spectrometer were investigated. As shown in this study, the spectrometer operates approximately diffraction-limited in the visible and uv, whereas in the vacuum uv (120.0 nm) the resolving power is still >54% of the diffraction-limited value. The spectrometer was designed according to the results of an analytical imaging theory. Residual optical aberrations were investigated by measuring the image distributions at four wavelengths between 120.0 and 632.8 nm (grating replaced by a plane mirror), in order to experimentally test the reliability of these theoretical results in combination with the influence of the imperfections of the optical components. The ratios of 40%-widths of the measured image distributions in the exit slit plane to the corresponding theoretical values were determined to be 0.56 at 120.0 nm, 0.68 at 174.0 nm, 0.74 at 257.3 nm, and 0.99 at 632.8 nm. Due to a lack of suitable light sources in the vacuum uv with sufficiently small band widths, the instrumental functions of the spectrometer could only be measured at 257.3, at 514.5, and at 632.8 nm, using stabilized and frequency doubled laser lines. The resolving powersR, which were deduced from the 40%-widths of the measured instrumental functions, were determined to be 1.42×106 [0.80] at 257.3 nm, 0.86×106 [0.97] at 514.5 nm, and 0.71×106 [0.98] at 632.8nm (ratiosR exp/R theor in brackets). The comparatively high resolving powerR≳0.02×106 [0.54] at 120.0 nm was estimated from the 40%-width of the measured image distribution.
Similar content being viewed by others
References
H. Walther, K.W. Rothe (eds.):Laser Spectroscopy IV, (Springer, Berlin, Heidelberg, New York 1979)
H. Nubbemeyer, B. Wende: Phys. Rev. A16, 627 (1977)
H. Nubbemeyer: Phys. Rev. A.21, 3 (1980)
The spectrometer has been additionally used for hyperfine structure measurements by a group from the Technische Universität Berlin in the short wavelength range, where conventional Fabry-Pérot spectrometers are no longer applicable
W. Leo: Z. Angew. Phys.8, 196 (1956).
M. Czerny, A.F. Turner: Z. Phys.61, 792 (1930)
G. Rosendahl: J Opt. Soc. Am.52, 412 (1962)
A.B. Shafer, L.R. Megill, L. Droppleman: J. Opt. Soc. Am.54, 879 (1964)
J.H. Callomon, G.G. Chandler: Appl. Opt.8, 1133 (1969)
J. Reader: J. Opt. Soc. Am.59, 1189 (1969)
R.C. Preston: U.K. National Physical Laboratory (private communication); see also R.C. Preston, U.K. National Physical Laboratory Quantum Metrology Report 13 (1970)
H. Nubbemeyer, B. Wende: Appl. Opt.16, 2708 (1977).
The master (33) was ruled on the interferometrically controlled MIT-B engine (in 1969) at the Massachusetts Institute of Technology, Cambridge, Mass.; see also G.H. Harrison, E.G. Loewen, R.S. Wiley: Appl. Opt.15, 971 (1976)
In this study, the image distribution generated by the optical system of the spectrometer (grating replaced by a plane mirror) is defined as the normalized irradianceE(y)/E(0) within the exit slit along the coordinatey. The image width is the 40%-width Δy 0.4 of the image distribution. However, due to the different usage in [11], the ray tracing width is introduced as the 50%-width Δy 0.5 of the image distribution. If the plane mirror is replaced by the echelle grating, the image distribution becomes the instrumental function
P.H. van Cittert: Z. Phys.65, 547 (1930)
R. Balhorn, H. Kunzmann, F. Lebowsky: Appl. Opt.11, 742 (1972)
According to the Rayleigh criterion, the resolving powerR of a spectrometer is approximately given byR≈λ/Δλ0.4. Δλ0.4 represents the 40%-width of the instrumental function experssed in wavelength units.R=nk is identical toR≈λ/Δλ0.4 in spectrometers with diffraction-limited resolving power
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Nubbemeyer, H., Wende, B. Optical properties of a 5 m echelle vacuum spectrometer with an approximately diffraction-limited resolving power in the order of 106 . Appl. Phys. 23, 259–266 (1980). https://doi.org/10.1007/BF00914909
Received:
Accepted:
Issue Date:
DOI: https://doi.org/10.1007/BF00914909