Ferromagnetic resonance in films with a plane anisotropy of electrical resistivity

Abstract

High conductivity of metallic films leads to attenuation of an ultrahigh frequency field at the depth of the skin layer and, consequently, to a nonuniform distribution of the high-frequency magnetization component over the film thickness. This feature leads to a shift in the frequency and to widening of the ferromagnetic resonance line in a metallic film. In the present work, we study the effect of the plane anisotropy of electrical resistivity on the resonance behavior of polycrystalline magnetic films (Ni, Co, permalloy). Appearance of this anisotropy is related to the presence in the film of extended structural defects such as microgaps oriented along the chosen direction of the substrate texture (Lavsan, mica). In the geometry of the perpendicular magnetization and the normal incident angle of the ultrahigh frequency wave with respect to the film there are two resonance frequencies corresponding to the two orthogonal polarizations of the high-frequency field.