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Measuring the magnetoresistance of orthogonal semiconductor samples

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Abstract

A method is proposed for measuring the physical magnetoresistance, the resistivity, and the Hall coefficient of semiconductor samples of orthogonal form. We obtain theoretical formulas by solving the corresponding electrodynamic boundary value problem; the solution takes the form of a complex Fourier series.

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Authors and Affiliations

  1. Lipetskii Pedagogical Institute, USSR

    N. N. Polyakov & A. D. Pashun

Authors
  1. N. N. Polyakov
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  2. A. D. Pashun
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Additional information

Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 11, pp. 85–89, November, 1989.

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Polyakov, N.N., Pashun, A.D. Measuring the magnetoresistance of orthogonal semiconductor samples. Soviet Physics Journal 32, 937–940 (1989). https://doi.org/10.1007/BF00898969

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  • DOI: https://doi.org/10.1007/BF00898969

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